Web24 mrt. 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. WebLeft: Ion beam image of BAM-L200, a certified reference material, at 30 kV and 1.1 pA. The area marked in red has been scanned with SIMS to collect the aluminum signal. Right: Aluminum TOF-SIMS signal (vertically integrated) showing the W8 (38 nm) and P8–P4 bands, left to right.
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Espectrometria de massa – Wikipédia, a enciclopédia livre
WebFerramentas. Espectrômetro de massa. A espectrometria de massas é uma técnica analítica física para detectar e identificar moléculas de interesse por meio da medição da sua massa e da caracterização de sua estrutura química. O princípio físico básico de um espectrômetro de massa consiste em criar íons de compostos orgânicos por ... WebCutting-Edge Nanomaterials. Jan. 2024–Heute5 Jahre 4 Monate. Stuttgart Area, Germany. CENmat is an innovative and vertically integrated electrolyser company that delivers the most economical, efficient, and critical raw material free electrolyser for affordable and real green hydrogen production. WebTime-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) uses a focused, energetic primary ion beam to analyse the sample surface. The ions that are sputtered, ionized and detected allow the composition of the sample to be characterised with high sensitivity (ppm), excellent depth resolution (1nm) and good lateral resolution (100nm). highway bridge design handbook